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Localization length of nearly periodic layered metamaterials

机译:近似周期性分层超材料的定位长度

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摘要

We have analyzed numerically the localization length of light $\xi$ fornearly periodic arrangements of homogeneous stacks (formed exclusively byright-handed materials) and mixed stacks (with alternating right andleft-handed metamaterials). Layers with index of refraction $n_1$ and thickness$L_1$ alternate with layers of index of refraction $n_2$ and thickness $L_2$.Positional disorder has been considered by shifting randomly the positions ofthe layer boundaries with respect to periodic values. For homogeneous stacks,we have shown that the localization length is modulated by the correspondingbands and that $\xi$ is enhanced at the center of each allowed band. In thelimit of long-wavelengths $\lambda$, the parabolic behavior previously found inpurely disordered systems is recovered, whereas for $\lambda \ll L_1 + L_2$ asaturation is reached. In the case of nearly periodic mixed stacks with thecondition $|n_1 L_1|=|n_2 L_2|$, instead of bands there is a periodicarrangement of Lorenztian resonances, which again reflects itself in thebehavior of the localization length. For wavelengths of several orders ofmagnitude greater than $L_1 + L_2$, the localization length $\xi$ dependslinearly on $\lambda$ with a slope inversely proportional to the modulus of thereflection amplitude between alternating layers. When the condition $|n_1L_1|=|n_2 L_2|$ is no longer satisfied, the transmission spectrum is veryirregular and this considerably affects the localization length.
机译:我们从数值上分析了均匀堆叠(仅由右手材料形成)和混合堆叠(左右手交替的超材料)形成的光$ \ xi $的近乎周期性排列的局部长度。折射率为$ n_1 $和厚度为$ L_1 $的层与折射率为$ n_2 $和厚度为LL_2 $的层交替。通过随机地改变层边界相对于周期值的位置,可以考虑位置无序。对于同质堆栈,我们已经表明,定位长度是由相应的频带调制的,并且$ \ xi $在每个允许频带的中心都得到增强。在长波长λ的极限中,先前发现的不纯的无序系统的抛物线行为得以恢复,而对于λλL_1 + L_2 $则达到了饱和。在条件为$ | n_1 L_1 | = | n_2 L_2 | $的近似周期性混合堆的情况下,存在洛伦兹共振的周期性排列,而不是频带,这再次以定位长度的行为反映出来。对于大于$ L_1 + L_2 $的几个数量级的波长,定位长度$ \ xi $线性依赖于$ \ lambda $,其斜率与交替层之间的反射幅度模量成反比。当不再满足条件$ | n_1L_1 | = | n_2 L_2 | $时,透射光谱非常不规则,这会极大地影响定位长度。

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    del Barco, O.; Ortuño, M.;

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  • 年度 2015
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